Highlighted Depth-of-Field Photography: Shining Light on Focus

Jaewon Kim1,2,      Roarke Horstmeyer1,       Ramesh Raskar1

1MIT Media Lab       2Korea Institute of Science and Technology(KIST)

 

 

Abstract

We present a photographic method to enhance intensity differences between objects at varying distances from the focal plane. By combining a unique capture procedure with simple image processing techniques, the detected brightness of an object is decreased proportional to its degree of defocus. A camera-projector system casts distinct grid patterns onto a scene to generate a spatial distribution of point reflections. These point reflections relay a relative measure of defocus that is utilized in postprocessing to generate a highlighted DOF photograph. Trade-offs between three different projectorprocessing pairs are analyzed, and a model is developed to help describe a new intensity-dependent depth of field that is controlled by the pattern of illumination. Results are presented for a primary single snapshot design as well as a scanning method and a comparison method. As an application, automatic matting results are presented.

          
                         
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BibTex Entry

@ARTICLE{Kim:2011:HDOF,
   author = {Jaewon Kim and Roarke Horstmeyer and Ig-Jae Kim and Ramesh Raskar},
   title = {Highlighted Depth-of-Field Photography: Shining Light on Focus},
   journal = {ACM Transactions on Graphics},
   year = {2011},
   volume = {30},
   number = {3},
}