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 Education
Massachusetts Institute of Technology (09/2008~08/2010) : Master's Degree
• Major: Media Arts and Sciences
• Academic Adviser : Ramesh Raskar
Korea Advanced Institute of Science and Technology (1999~2001) : Master's Degree
• Major: Mechanical engineering
• Thesis topic: The pose estimation of polyhedral objects based on geometric
features in X-ray image
• Academic Adviser: Professor Hyungsuck Cho
Korea Advanced Institute of Science and Technology (1995~1999) : Bachelor's Degree
• Major: Mechanical engineering
 Job Career
• Instructor at Dept. of Digital Media, Catholic University of Korea
- Lectures on Computational Photography
• Research scientist at Imaging Media Research Center, KIST (09/2010~)
• Research assistant at Media Lab, MIT(2008.9~2010.8)
• Samsung Electronics Co., LTD, (2001.8~2008.8)
- Research Engineer: 2001.8~2007.12
- Senior Engineer: 2008.1~2008.8
• Research assistant at LCA lab, KAIST(1999~2001)
Publications
• Jaewon Kim, Roarke Horstmeyer, Ig-Jae Kim, and Ramesh Raskar, "Highlighted Depth-of-Field Photography: Shining Light on Focus", ACM Transactions on Graphics (TOG), Vol. 30, No. 3, Article 24, May 2011
[SIGGRAPH 2011 Oral Presentation]
• S.Tagawa, Y.Mukaigawa, J.Kim, R.Raskar, Y.Matsushita, and Y.Yagi, ``Hemispherical Confocal Imaging'', IPSJ Transactions on Computer Vision and Applications, Vol. 3, pp.222-235, Dec. 2011
• Jaewon Kim, Douglas Lanman, Yasuhiro Mukaigawa, and Ramesh Raskar, "Descattering Transmission via Angular Filtering", European Conference on Computer Vision(ECCV) 2010
• Yasuhiro Mukaigawa, Seiichi Tagawa, Jaewon Kim, Ramesh Raskar, Yasuyuki Matsushita, and Yasushi Yagi, “Hemispherical Confocal Imaging using Turtleback Reflector”, ACCV 2010
• J.W. Kim, Y.J. Roh and H.S. Cho, "6 DOF pose estimation of polyhedral objects based on geometric features in X-ray images", SPIE Optomechatronic Systems, 2001.
• J.W. Kim, Y.J. Roh and H.S. Cho, “Edge and Corner points detection in Xray image of polyhedral object”, Journal of Control, Automation, and System Engineering(JCASE), Korea, 2001
• K.W. Ko, J.W. Kim, H.S. Cho, K.S. Jin and K.I. Koh, "Enhancement of placement accuracy for SMD via development of a new illumination system", SPIE Optomechatronic Systems, Volume 4190, pp.51-61, Boston, USA, 2000.
• Y. J. Roh, J. W. Kim, H. S. Cho, H. J. Jeun, H. C. Kim, H. M. Ju, "Correction of Image Distortion and Coordinate Calibration of the X-ray three dimensional imaging system", KACC, 2000.
Patents
• “Reconstruction of a Zoom-in image based on web-image database”, Korea 20110081157, USA (issuing)
• “Apparatus and method to recognize the locations of markers in real-time”, Korea 20110069471
• “3D finger vein authentication”, MIT 13692T(issuing)
• “6DOF motion system for LCD module inspection system”, Korea 20020086531
• “Radioactive image apparatus and focus control method thereof”, Korea 20020031108; Japan 2004012459;
USA 6,830,376
• “Method for embodying 3-dimensional image of X-ray photographing unit”, Korea 20010040380
• “Distorted Brightness Compensation System and Distorted Brightness Compensation Method”, Korea 20020085061
• “Image processing system and method”, Korea 20020080340; China 1509068A; USA 200400114198(open)
• “Method of inspecting a flat panel display”, Korea 20040002657; USA 20050151760(open)
• “Video processing system and video processing method”, Japan 2004201284
• “Three-dimensional image constructing method using X-ray apparatus”, USA 6,415,014
• “Panel Inspecting Method”, Korea 20060022516
Experience
• 3D Hand Gesture Interface, KIST (09/2010~)
• Super-resolution technique based on web-images, KIST (09/2010~)
• Descattering of transmitted light through scattering media, MIT Media Lab (2009.04 ~ 2009.12)
• Depth-dependant photography, MIT Media Lab (2009.04 ~ 2009.9)
• 3D reconstruction of translucent objects by a single shot photo, MIT Media Lab (2008.09 ~ 2009.3)
• The development of illumination system and vision algorithm for vision inspection in surface mounting device,
Mirae Corporation.(1999.12 ~ 2000.06 in master program)
• The development of X-ray system for inspection of electronic parts,
Samsung Electronics Co., LTD. (2000.01 ~ 2000.10 in master program)
• The development of 3D shape measurement method using X-ray images,
POSCO. (2000.03~2001.02 in master program)
• The development of 3D X-ray imaging system for inspection electronic package,
Samsung Electronics Co., LTD. (2000.11 ~ 2002.06 in master program)
• The development of vision system to detect automatically defects in LCD module assembly lines,
Samsung Electronics Co., LTD. (2002.07 ~ 2007.08 in my company )
• Rapid measurement method for critical dimension of semiconductor wafer using laser optics,
Samsung Electronics Co., LTD. (2007.08 ~ , in my company )
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